Scanning Transmission Electron Microscope
The scanning electron microscope is used to characterize the structure of conductive and non-conductive material specimens, including chemical analysis using an energy dispersive spectrometer while applying the desired detection (secondary electrons, backscattered electrons or scanning transmission electron microscopy). By combining scanning transmission electron microscopy and atomic force microscopy using a unique imaging technique called "Correlative Probe and Electron Microscopy", the system facilitates simultaneous characterization of the surfaces of the samples under investigation to obtain information about their topography.